Title:
METHOD AND SYSTEM FOR DETERMINING ABNORMALITY OF MEDICAL DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/235804
Kind Code:
A1
Abstract:
The present disclosure relates to a method for determining an abnormality of a medical device from medical images. The method for determining an abnormality of a medical device comprises the steps of: receiving medical images; and detecting information, included in the received medical images, about at least a part of a medical device.
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Inventors:
YOO DONGGEUN (KR)
LEE SANGHYUP (KR)
KIM MINCHUL (KR)
LEE HANJUN (KR)
PARK SUNGGYUN (KR)
LEE SANGHYUP (KR)
KIM MINCHUL (KR)
LEE HANJUN (KR)
PARK SUNGGYUN (KR)
Application Number:
PCT/KR2021/006163
Publication Date:
November 25, 2021
Filing Date:
May 17, 2021
Export Citation:
Assignee:
LUNIT INC (KR)
International Classes:
A61B6/12; A61B5/00; A61B6/00; G06T7/00; G06T7/10; G16H30/40; G16H50/20
Foreign References:
KR20190130310A | 2019-11-22 | |||
JP2009519083A | 2009-05-14 | |||
JP2019524284A | 2019-09-05 | |||
KR102013857B1 | 2019-08-23 | |||
US20150094736A1 | 2015-04-02 |
Attorney, Agent or Firm:
KIM, Han Sol et al. (KR)
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