Title:
A METHOD AND SYSTEM FOR ENHANCING A MICROSCOPY IMAGE
Document Type and Number:
WIPO Patent Application WO/2010/101525
Kind Code:
A8
Abstract:
A microscopy image, formed by illuminating a sample by shining light onto it in an illumination direction and capturing scattered light, is used to produce an enhanced image. This is done using an expression which links the intensity of the portions of the image to respective values of a scattering parameter at multiple respective elements of the sample. The scattering parameter may be an emission coefficient ρ
em
or else equal to an absorption coefficient ρ
ab
. This expression is solved to find the values of the scattering parameter. The scattering parameter is used to construct an enhanced image, for example an image which maps the variation of the scattering parameter itself. Provided the scattering parameter is found accurately, the enhanced image should be less subject than the original image to degradation due to non-uniform light attenuation and scattering.
Inventors:
LEE HWEE GUAN (SG)
UDDIN MOHAMMAD SHORIF (SG)
UDDIN MOHAMMAD SHORIF (SG)
Application Number:
PCT/SG2010/000051
Publication Date:
October 13, 2011
Filing Date:
February 11, 2010
Export Citation:
Assignee:
AGENCY SCIENCE TECH & RES (SG)
LEE HWEE GUAN (SG)
UDDIN MOHAMMAD SHORIF (SG)
LEE HWEE GUAN (SG)
UDDIN MOHAMMAD SHORIF (SG)
International Classes:
G02B21/00; G06T5/00
Attorney, Agent or Firm:
WATKIN, Timothy, Lawrence, Harvey (Tanjong PagarPO Box 636, Singapore 6, SG)
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