Title:
A METHOD AND SYSTEM FOR INFRARED DETECTION OF ELECTRICAL SHORT DEFECTS
Document Type and Number:
WIPO Patent Application WO2002045277
Kind Code:
A3
Abstract:
A method and system (200) for detecting electrical short circuit defects in a plate structure of a flat panel display (205), for example, a field emission display (FED). In one embodiment, the process first applies a stimulation (204) to the electrical conductors of the plate structure. Next, the process creates an infra-red thermal mapping (210) of a cathode region the FED. For example, an infra-red array may be used to snap a picture of the cathode of the FED.Then , the process analyzes (100) the infra-red thermal mapping to determine a region of the FED which contains the electrical short circuit defect (215). Another embodiment localizes the defect to one sub-pixel by performing an infra-red mapping (212) of the region which the previous IR mapping process determined to contain the electrical short circuit defect (215). Then, the process analyzes (100) this infra-red mapping to determine a sub-pixel of the FED which contains the electrical short circuit defect (215).
Inventors:
ENACHESCU MARIUS
BELIKOV SERGEY
MEIER STEPHEN F
BELIKOV SERGEY
MEIER STEPHEN F
Application Number:
PCT/US2001/044443
Publication Date:
February 12, 2004
Filing Date:
November 28, 2001
Export Citation:
Assignee:
CANDESCENT TECH CORP (US)
International Classes:
G01N25/72; G01M11/00; G01R31/308; G09F9/00; G09G3/00; H01J9/42; (IPC1-7): G01R31/28; G01R31/302
Foreign References:
| US6111424A | 2000-08-29 | |||
| US5751262A | 1998-05-12 | |||
| US5424605A | 1995-06-13 | |||
| US6046429A | 2000-04-04 | |||
| US5307077A | 1994-04-26 |
Other References:
See also references of EP 1405091A4
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