Title:
METHOD AND SYSTEM FOR MEASURING AND ANALYZING THE PRODUCTION DATA DIRECTLY FROM MACHINE
Document Type and Number:
WIPO Patent Application WO/2010/092588
Kind Code:
A3
Abstract:
The present invention relates to a method for measuring and analyzing the production data directly from machines. The said method comprises the steps of : a. measuring the parameters relating to machine and parameters of the process to be carried on by machine; b. storing values of parameters measured for the analysis purpose; c. providing standard values of said parameters being provided by the user; d. comparing said standard values and the measured values of the parameters for checking performance of machine and consistency in product quality; e. deciding whether the machine performance and product quality are consistently maintained to required standards; and f. displaying the standard values and measured values of said parameters, and decision taken in respect of machine performance and product quality. Also the system for implementing the aforesaid method is disclosed.
Inventors:
GUPTA NITIN (IN)
KOTWAL RUPESH VASANT (IN)
KOTWAL RUPESH VASANT (IN)
Application Number:
PCT/IN2009/000296
Publication Date:
December 15, 2011
Filing Date:
May 22, 2009
Export Citation:
Assignee:
GUPTA NITIN (IN)
KOTWAL RUPESH VASANT (IN)
KOTWAL RUPESH VASANT (IN)
International Classes:
G05B19/418; G06Q10/00; G07C3/00; G07C3/14
Domestic Patent References:
| WO2002013105A2 | 2002-02-14 |
Foreign References:
| CN1474328A | 2004-02-11 | |||
| JP2002236511A | 2002-08-23 | |||
| US5923553A | 1999-07-13 | |||
| US6038540A | 2000-03-14 |
Attorney, Agent or Firm:
NAIR, Gopakumar, G. (Gopakumar Nair Associates3Rd Floor, Shivmangal,Near Big Bazaa, Akurli Road Kandivali Mumbai 1 Maharashtra, IN)
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