Title:
METHOD AND SYSTEM FOR MEASURING REFERENCE POINTS ON STRUCTURE
Document Type and Number:
WIPO Patent Application WO/2015/045021
Kind Code:
A1
Abstract:
A target (10) is affixed to each of a plurality of reference points (S1 through S16) in a prescribed region of a structure (1), and a 3D measuring instrument (18) set up in a middle section (O) of a first polygon (G1), the vertices of which consist of three or more of the reference points (S), determines 3D coordinates for each of the reference points (S1 through S6) on the first polygon (G1) in a prescribed coordinate system by obtaining 3D vectors representing the positions of the vertices of the first polygon (G1) relative to the 3D measuring instrument (18). Next, the following process is repeated: the 3D measuring instrument (18) is moved to a middle section (P(n), n being an integer greater than or equal to 2) from which each vertex of an nth polygon (G(n)) can be seen, said vertices consisting of three or more reference points for which coordinates have been determined and one or more reference points for which coordinates have not been determined yet, the 3D measuring instrument (18) sights each of said vertices to obtain 3D vectors representing the positions thereof relative to the 3D measuring instrument (18), and 3D coordinates for the point (P(n)) to which the 3D measuring instrument (18) was moved and 3D coordinates for the reference points on the nth polygon (G(n)) for which coordinates have not been determined yet, said 3D coordinates being in the abovementioned coordinate system, are determined. After thus determining 3D coordinates for each reference point (S) in the abovementioned prescribed region, network averaging is used to finalize the 3D coordinates for each reference point (S).
Inventors:
MURATA TOYOTOSHI (JP)
YAMAMOTO KAZUHITO (JP)
YAMAMOTO KAZUHITO (JP)
Application Number:
PCT/JP2013/075830
Publication Date:
April 02, 2015
Filing Date:
September 25, 2013
Export Citation:
Assignee:
BIG SURVEY & DESIGN CO LTD (JP)
International Classes:
G01C15/00
Foreign References:
| JP2001080845A | 2001-03-27 | |||
| JPH08189827A | 1996-07-23 | |||
| JP2009097985A | 2009-05-07 |
Attorney, Agent or Firm:
SHITO Atsushi et al. (JP)
市東 篤 (JP)
市東 篤 (JP)
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