Title:
METHOD AND SYSTEM FOR MEASURING TRANSPARENT EFFECT OF TRANSPARENT DISPLAY
Document Type and Number:
WIPO Patent Application WO/2018/214255
Kind Code:
A1
Abstract:
A method and system for measuring a transparent effect of a transparent display. The method for measuring a transparent effect of a transparent display comprises: separately acquiring brightness information of a background pattern (3) in a state of having a transparent display (4) and in a state of having no transparent display (4) by means of a brightness information acquiring module (2); separately calculating a brightness gradient area width (dHi1, dHi2, dVn1, dVn2) at each horizontal or vertical black and white brightness adjacent point (AHi1, AHi2, AVn1, AVn2) on the background pattern (3) in the state of having the transparent display (4) and in the state of having no transparent display (4) by means of a data processing module (1); then calculating a ratio of corresponding brightness gradient area widths (dHi1, dHi2, dVn1, dVn2) at each horizontal or vertical black and white brightness adjacent point (AHi1, AHi2, AVn1, AVn2) in the state of having the transparent display (4) and in the state of having no transparent display (4) by means of the data processing module (1), and using the ratio as a definition of the corresponding horizontal or vertical black and white brightness adjacent point (AHi1, AHi2, AVn1, AVn2); finally, by means of the data processing module (1), calculating an average value of definitions of all horizontal black and white brightness adjacent points (AHi1, AHi2) as a horizontal definition of the transparent display(4), and calculating an average value of definitions of all vertical black and white brightness adjacent points (AVn1, AVn2) as a vertical definition of the transparent display (4); and determining a transparent effect of the transparent display (4) according to the definitions.
Inventors:
WANG LIMIN (CN)
Application Number:
PCT/CN2017/092870
Publication Date:
November 29, 2018
Filing Date:
July 13, 2017
Export Citation:
Assignee:
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD (CN)
International Classes:
G01M11/02
Foreign References:
| CN104931238A | 2015-09-23 | |||
| CN103900795A | 2014-07-02 | |||
| CN105074507A | 2015-11-18 | |||
| CN104165753A | 2014-11-26 | |||
| KR20160043179A | 2016-04-21 | |||
| CN102967443A | 2013-03-13 | |||
| KR20150034465A | 2015-04-03 |
Attorney, Agent or Firm:
COMIPS INTELLECTUAL PROPERTY OFFICE (CN)
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