Title:
METHOD AND SYSTEM FOR PROCESSING AND MEASURING MICROPARTICLES
Document Type and Number:
WIPO Patent Application WO/2004/046695
Kind Code:
A2
Abstract:
Particles dispersed in a liquid are assembled in a configuration in which all the particles lie in the same plane, and the assembled particles are processed while in that configuration. The assembled particles can for example be simultaneously exposed to electromagnetic radiation which elicits from the particles a response which provides information about the particles. The particles can for example be cells, cell fragments, or analyte-bearing beads of the type conventionally analyzed in a cytometer.
Inventors:
RAKESTRAW DAVID J
ARNOLD DON W
PAUL PHILLIP H
ARNOLD DON W
PAUL PHILLIP H
Application Number:
PCT/US2003/036533
Publication Date:
June 03, 2004
Filing Date:
November 14, 2003
Export Citation:
Assignee:
EKSIGENT TECHNOLOGIES LLC (US)
International Classes:
G01N15/14; G01N21/05; G01N33/543; G01N21/64; G01N27/447; G01N35/00; (IPC1-7): G01N21/00
Domestic Patent References:
| WO2001038865A1 | 2001-05-31 |
Foreign References:
| US6406843B1 | 2002-06-18 |
Attorney, Agent or Firm:
Sheldon, Jeffrey G. (225 South Lake Avenue Suite 90, Pasadena CA, US)
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