METHOD FOR THERMAL ANALYSIS AND SYSTEM FOR THERMAL ANALYSIS

Title:

METHOD FOR THERMAL ANALYSIS AND SYSTEM FOR THERMAL ANALYSIS

Document Type and Number:

WIPO Patent Application WO/2003/044509

Kind Code:

A1

Abstract:

A method and a system for thermally analyzing a very small part of a sample by measuring, by utilizing infrared rays thermal characteristics at a very small part of the sample based on a temperature variation being imparted to at least a part of the sample being measured.

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Inventors:

HASHIMOTO TOSHIMASA (JP)
MORIKAWA JUNKO (JP)

Application Number:

PCT/JP2002/012076

Publication Date:

May 30, 2003

Filing Date:

November 19, 2002

Export Citation:

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Assignee:

CIRCLE PROMOTION SCIENCE & ENG (JP)
HASHIMOTO TOSHIMASA (JP)
MORIKAWA JUNKO (JP)

International Classes:

G01N25/18; G01N25/72; (IPC1-7): G01N25/18

Foreign References:

JPS6413446A	1989-01-18
JPH07103921A	1995-04-21
JP2000121585A	2000-04-28
JPH10221279A	1998-08-21
JPH10318953A	1998-12-04
JPH11218509A	1999-08-10

Other References:

MASANOBU KOBAYASHI, AKIRA ONO, JAPANESE JOURNAL OF OPTICS, vol. 17, no. 10, 1988, pages 522 - 523, XP002961733
JUNKO MORIKAWA, TOSHIMASA HASHIMOTO: "Netsu sokutei toron koen yoshishu", vol. 37, 5 November 2001 (2001-11-05), pages 22 - 23, XP002961734
JUNKO MORIKAWA, TOSHIMASA HASHIMOTO, MEMBRANE, vol. 25, no. 6, 2000, pages 316 - 317, XP002961735

Attorney, Agent or Firm:

Ishida, Takashi (ISHIDA & ASSOCIATES Toranomon 37 Mori Bldg., 5-1, Toranomon 3-chom, Minato-ku Tokyo, JP)

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