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Title:
A METHODE AND DEVICE FOR MODELING POWER SUPPLY NOISE
Document Type and Number:
WIPO Patent Application WO/2009/036702
Kind Code:
A1
Abstract:
A power supply noise modeling method is disclosed, for solving the problem that the existing power supply noise model is inaccurate. The method includes: sampling the voltage of the power testing nodes which be selected from each of the IC chips in a single-chip; obtaining a frequency domain voltage sequences by transforming the voltage into frequency domain; obtaining a impedance matrix based on each of voltage testing nodes which be selected as testing ports; achieving the power supply noise model by the inversion of the impedance matrix multiplied by the voltage sequences. Each of the power supply noise models can be used for designing PDS accurately, and can reduce the cost of the design in PDS.

Inventors:
JIN ZHAOGUO (CN)
Application Number:
PCT/CN2008/072382
Publication Date:
March 26, 2009
Filing Date:
September 17, 2008
Export Citation:
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Assignee:
HUAWEI TECH CO LTD (CN)
JIN ZHAOGUO (CN)
International Classes:
G06F17/16; G06F17/50
Foreign References:
CN1622097A2005-06-01
CN1731407A2006-02-08
US20030057966A12003-03-27
JP2001175702A2001-06-29
Other References:
TIAN ZHIXIN ET AL.: "Combined Novel Gate Level Model and Critical Primary Input Sharing for Genetic Algorithm Based Maximum Power Supply Noise Estimation", CHINESE JOURNAL OF SEMICONDUCTORS, vol. 28, no. 9, September 2007 (2007-09-01), pages 1375 - 1378
QIAN, ZHIHONG: "Study on noise models algorithms and matrix descriptions for integrated circuits", JOURNAL OF NORTHEAST NORMAL UNIVERSITY, vol. 35, no. 2, June 2003 (2003-06-01), pages 52 - 57
Attorney, Agent or Firm:
BEIJING ZBSD PATENT & TRADEMARK AGENT LTD. (Fortune BuildingNo.17 Daliushu Road, Haidian District, Beijing 1, CN)
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