Title:
METHODS FOR MAKING AN X-RAY DETECTOR
Document Type and Number:
WIPO Patent Application WO/2017/041221
Kind Code:
A1
Abstract:
An apparatus suitable for detecting X-ray, the apparatus comprising: a first substrate (122) comprising a plurality of first electric contacts (125); a first chip layer (110) comprising a plurality of first chips (189), wherein each of the first chips (189) comprises a first electrode and is bonded to the first substrate(122) such that the first electrode is electrically connected to at least one of the first electrical contacts (125); a second substrate(122) comprising a plurality of second electric contacts (125); and a second chip layer(110) comprising a plurality of second chips (189), wherein each of the second chips (189) comprises a second electrode and is bonded to the second substrate (122) such that the second electrode is electrically connected to at least one of the second electrical contacts (125), wherein the first chip layer (110) and the second chip layer (110) are bonded to each other such that at least two second chips (189) are bonded to a same first chip (189).
Inventors:
CAO PEIYAN (CN)
LIU YURUN (CN)
LIU YURUN (CN)
Application Number:
PCT/CN2015/089103
Publication Date:
March 16, 2017
Filing Date:
September 08, 2015
Export Citation:
Assignee:
SHENZHEN XPECTVISION TECH CO LTD (CN)
International Classes:
G01T1/24
Domestic Patent References:
| WO2013012809A1 | 2013-01-24 | |||
| WO2002103391A1 | 2002-12-27 |
Foreign References:
| CN1675780A | 2005-09-28 | |||
| CN103430533A | 2013-12-04 | |||
| CN101903802A | 2010-12-01 | |||
| CN1947660A | 2007-04-18 |
Other References:
See also references of EP 3347741A4
Attorney, Agent or Firm:
SHENZHEN ARK INTELLECTUAL PROPERTY AGENT LLP (CN)
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