Title:
METHODS FOR MEASURING AND CONTROLLING THE TEMPERATURE OF LIQUID PHASE IN MICRO PASSAGE OF MICROCHIP, DEVICE FOR THE METHODS, AND MICROCHIP
Document Type and Number:
WIPO Patent Application WO/2002/090912
Kind Code:
A1
Abstract:
Novel technical means capable of measuring and controlling the temperature of a liquid phase in a micro passage of a microchip highly accurately by measuring the temperature of the liquid phase in the micro passage of the microchip in a noncontact manner by measuring the luminous intensity of light from a fluorescent substance or by measuring it by means of a sensing means buried in the microchip, and by heating the liquid phase by irradiating it with infrared laser beam.
Inventors:
KITAMORI TAKEHIKO (JP)
SLYADNEV MAXIM (JP)
TOKESHI MANABU (JP)
HIBARA AKIHIDE (JP)
KIN YUKIO (JP)
SLYADNEV MAXIM (JP)
TOKESHI MANABU (JP)
HIBARA AKIHIDE (JP)
KIN YUKIO (JP)
Application Number:
PCT/JP2001/010450
Publication Date:
November 14, 2002
Filing Date:
November 29, 2001
Export Citation:
Assignee:
KANAGAWA KAGAKU GIJUTSU AKAD (JP)
KITAMORI TAKEHIKO (JP)
SLYADNEV MAXIM (JP)
TOKESHI MANABU (JP)
HIBARA AKIHIDE (JP)
KIN YUKIO (JP)
KITAMORI TAKEHIKO (JP)
SLYADNEV MAXIM (JP)
TOKESHI MANABU (JP)
HIBARA AKIHIDE (JP)
KIN YUKIO (JP)
International Classes:
B01L3/00; G01K7/42; G01K11/20; (IPC1-7): G01K1/14; G01K7/02; G01K11/20; G01N25/16; G01N37/00
Foreign References:
| JPH09262084A | 1997-10-07 | |||
| JP2000029541A | 2000-01-28 |
Attorney, Agent or Firm:
Nishizawa, Toshio (37-10 Udagawa-ch, Shibuya-ku Tokyo, JP)
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