Title:
MICRO LIGHT-EMITTING DIODE TEST SYSTEM AND TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2023/197537
Kind Code:
A1
Abstract:
A micro light-emitting diode test system and a test method. The test system comprises a first light generation module (11) used for sending a first light signal to a plurality of micro light-emitting diodes (21) to be tested, so that the plurality of micro light-emitting diodes (21) to be tested generate second light signals; a hyperspectral camera (31), used for collecting the second light signals to obtain a spectral imaging frame, the spectral imaging frame comprising spectral data of each of the plurality of micro light-emitting diodes (21) to be tested; and a control module (41) connected to the hyperspectral camera (31) and used for determining, on the basis of the spectral imaging frame, a defective micro light-emitting diode from the plurality of micro light-emitting diodes (21) to be tested, wherein the plurality of micro light-emitting diodes (21) to be tested excite themselves after receiving light energy in the first light signal to generate the second light signals.
Inventors:
WANG WEI (CN)
BI HAI (CN)
DUAN JIANGWEI (CN)
ZHANG HEMING (CN)
KE LIANBAO (CN)
YANG WANLI (CN)
HE ZHAOMING (CN)
BI HAI (CN)
DUAN JIANGWEI (CN)
ZHANG HEMING (CN)
KE LIANBAO (CN)
YANG WANLI (CN)
HE ZHAOMING (CN)
Application Number:
PCT/CN2022/122977
Publication Date:
October 19, 2023
Filing Date:
September 30, 2022
Export Citation:
Assignee:
JI HUA LABORATORY (CN)
International Classes:
G01M11/02; G01R31/26
Foreign References:
| CN114441149A | 2022-05-06 | |||
| CN111610177A | 2020-09-01 | |||
| CN114235759A | 2022-03-25 | |||
| CN112798234A | 2021-05-14 | |||
| CN113218628A | 2021-08-06 | |||
| CN113532641A | 2021-10-22 | |||
| CN113514480A | 2021-10-19 | |||
| KR102286322B1 | 2021-08-06 |
Attorney, Agent or Firm:
ADVANCE CHINA IP LAW OFFICE (CN)
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