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Patent Searching and Data


Title:
MICROPARTICLE ANALYZING DEVICE AND MICROPARTICLE ANALYZING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2014/122873
Kind Code:
A1
Abstract:
Provided are a microparticle analyzing device and microparticle analyzing system capable of identifying and separating, with precision, individual microparticles without using a marker. A microparticle analyzing device is provided with a sample channel in which a liquid containing a plurality of microparticles is introduced, a first electrode pair for forming an alternating electric field in at least a portion of the sample channel, a measuring unit to measure the impedance between the first electrode pair, an analyzing unit to calculate the microparticle property values from the impedance measured by the measuring unit, and a determining unit to determine whether the data for the impedance measured by the measuring unit was originated in the microparticles.

Inventors:
BRUN MARCAURELE (JP)
SATO KAZUMASA (JP)
OMORI SHINJI (JP)
KATSUMOTO YOICHI (JP)
Application Number:
PCT/JP2013/084878
Publication Date:
August 14, 2014
Filing Date:
December 26, 2013
Export Citation:
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Assignee:
SONY CORP (JP)
International Classes:
G01N27/02; G01N15/12; G01N37/00
Domestic Patent References:
WO2011067961A12011-06-09
WO2012003348A22012-01-05
Foreign References:
JP2010181399A2010-08-19
JPS6329267A1988-02-06
JP2012098058A2012-05-24
JP2011112497A2011-06-09
JPH07509560A1995-10-19
JP2001305041A2001-10-31
JP2005512042A2005-04-28
JP2010181399A2010-08-19
JP2012098063A2012-05-24
Other References:
See also references of EP 2955512A4
Attorney, Agent or Firm:
WATANABE KAORU (JP)
Kaoru Watanabe (JP)
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