Title:
MICROPARTICLE MEASUREMENT DEVICE AND MICROPARTICLE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2018/047442
Kind Code:
A1
Abstract:
Provided is a microparticle measurement device and microparticle measurement method with which it is possible to improve the efficiency of measurement in microparticle measurement which optically measures the properties of microparticles. This microparticle measurement device comprises: a detection unit that detects light from microparticles fed from one of a plurality of containers containing microparticles; and an information processing unit which specifies a characteristic quantity pertaining to the number of detections in a given time interval on the basis of information detected by the detection unit, determines whether the characteristic quantity is abnormal on the basis of a predetermined threshold value, and terminates the detection with respect to the single container.
Inventors:
TAHARA KATSUTOSHI (JP)
Application Number:
PCT/JP2017/023465
Publication Date:
March 15, 2018
Filing Date:
June 27, 2017
Export Citation:
Assignee:
SONY CORP (JP)
International Classes:
G01N15/14
Domestic Patent References:
| WO2014024556A1 | 2014-02-13 | |||
| WO2011013595A1 | 2011-02-03 | |||
| WO2015064628A1 | 2015-05-07 | |||
| WO2014115409A1 | 2014-07-31 |
Foreign References:
| JP2010271168A | 2010-12-02 | |||
| JP2015222202A | 2015-12-10 | |||
| JP2013044585A | 2013-03-04 |
Other References:
See also references of EP 3511691A4
Attorney, Agent or Firm:
WATANABE Kaoru (JP)
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