MICROSCOPE DEVICE AND ANALYSIS METHOD

WIPO Patent Application WO/2015/133475

A1

[Problem] To provide a microscope device capable of highly accurate classification of subjects, and capable of unstained analysis. [Solution] The device has: a light source for illuminating a subject with light; an imaging means for imaging an image of the subject onto a primary image surface; an image pickup means provided with a detector which, during pickup of an image, is impinged upon by diffused light beams from an image, and which acquires a signal based on the impinging light beams, and with moving means for moving the image pickup location in a prescribed direction; a control means for controlling the timing of image pickup; a control means for controlling the moving means; a means for creating, on the basis of the signal, first data having one-dimensional space information at image pickup locations, and high-resolution wavelength information, as well as creating, from the first data at the image pickup locations, second data having two-dimensional space information and one-dimensional wavelength information; a means for creating a spectral image for each wavelength from the second data; a means for acquiring the spectral radiant luminance, spectral luminance, and spectral reflectivity or spectral transmittance at each pixel of a spectral image; and a means for carrying out an analysis process of a spectral image, by a prescribed analysis technique.

NORO NAOKI (JP)
TAKARA YOHEI (JP)
ANDO FUMINORI (JP)
FUJIMORI TAKAHIRO (JP)

PCT/JP2015/056217

September 11, 2015

March 03, 2015

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EBA JAPAN CO LTD (JP)
NORO NAOKI (JP)

G02B21/00; G01N21/27

US20130229663A1	2013-09-05
JP2014016531A	2014-01-30
JP2005072967A	2005-03-17
JP2001292369A	2001-10-19

KAMEYA, Yoshiaki et al. (JP)
Yoshiaki Kameya (JP)

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