Title:
MICROSCOPE SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/106730
Kind Code:
A1
Abstract:
The present invention serves to determine conditions for acquiring a second image having improved image quality. An input layer 701 receives values xi obtained by downsampling the luminance values of a first image 710 that is input. A convolution layer 702 performs a convolution operation by scanning a filter. An output layer 703 receives outputs z1 to z4 from the convolution layer 702 as well as first acquisition conditions v = (v1, v2, v3, v4) for the first image and calculates second acquisition conditions y.
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Inventors:
HATTO MAO (JP)
SASAKI YUTAKA (JP)
TAKAHASHI HIDEO (JP)
YOSHIDA NORIO (JP)
SASAKI YUTAKA (JP)
TAKAHASHI HIDEO (JP)
YOSHIDA NORIO (JP)
Application Number:
PCT/JP2017/042685
Publication Date:
June 06, 2019
Filing Date:
November 28, 2017
Export Citation:
Assignee:
NIKON CORP (JP)
International Classes:
G02B21/36
Foreign References:
| JP2003121749A | 2003-04-23 | |||
| JPH064601A | 1994-01-14 | |||
| JP2010181833A | 2010-08-19 |
Attorney, Agent or Firm:
TAIYO, NAKAJIMA & KATO (JP)
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