Title:
MICROSCOPIC OBSERVATION SYSTEM, MICROSCOPIC OBSERVATION METHOD, AND MICROSCOPIC OBSERVATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2017/163427
Kind Code:
A1
Abstract:
A microscopic observation system according to the present invention comprises: an imaging unit that captures a subject image created by an observation optical system of a microscope and creates the actual image of the subject; a control unit that sets the imaging condition of the imaging unit and acquires the actual image of the subject image; and an imaging control unit that controls the imaging unit on the basis of the imaging condition set by the control unit. The control unit includes a first pre-capture condition setting unit for setting the imaging condition of first pre-capture whereby a preliminary image is acquired to create the actual image. The first pre-capture is sweep imaging whereby the subject is captured by changing the position of the focal plane. The control unit sets an imaging condition in which the preliminary image acquired by sweep imaging is free from brightness saturation, and acquires the actual image on the basis of the preliminary image.
Inventors:
ABE YOKO (JP)
Application Number:
PCT/JP2016/059761
Publication Date:
September 28, 2017
Filing Date:
March 25, 2016
Export Citation:
Assignee:
OLYMPUS CORP (JP)
International Classes:
G02B21/00; G01N21/27; G01N21/64; H04N5/225
Foreign References:
| JP2014142637A | 2014-08-07 | |||
| JP2014021487A | 2014-02-03 |
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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