Title:
MICROWAVE PHOTON VECTOR NETWORK ANALYZING DEVICE AND MEASURING METHOD FOR MICROWAVE COMPONENT SCATTERING PARAMETER
Document Type and Number:
WIPO Patent Application WO/2019/210671
Kind Code:
A1
Abstract:
A microwave photon vector network analyzing device and a measuring method for a microwave component scattering parameter. The device comprises a microwave source (1). Provided sequentially in a signal output direction of the microwave source (1) are a signal loading module (2), an optical sampling module (3), and a signal processing module (4). An output end of the signal processing module (4) is connected respectively to a control end of the microwave source (1) and that of the optical sampling module (3). Either test port of the signal loading module (2) is connected to either end of a component to be tested. The device is capable of direct sampling of and frequency conversion with respect to a microwave signal, obviates a superheterodyne structure and/or a direct conversion structure in a conventional network analyzing instrument, thus simplifying system structure while increasing the range of measurement frequencies and avoiding problems such as mirror interference, and reducing system complexity, costs, and power consumption.
Inventors:
WU GUILING (CN)
DING MIN (CN)
JIN ZHENG TAO (CN)
CHEN JIANPING (CN)
DING MIN (CN)
JIN ZHENG TAO (CN)
CHEN JIANPING (CN)
Application Number:
PCT/CN2018/114490
Publication Date:
November 07, 2019
Filing Date:
November 08, 2018
Export Citation:
Assignee:
UNIV SHANGHAI JIAOTONG (CN)
International Classes:
G01R27/28
Foreign References:
| CN108614162A | 2018-10-02 | |||
| CN105547654A | 2016-05-04 | |||
| CN107132027A | 2017-09-05 | |||
| CN103454542A | 2013-12-18 | |||
| CN103715480A | 2014-04-09 | |||
| CN104363047A | 2015-02-18 | |||
| US8184988B2 | 2012-05-22 | |||
| US20160269122A1 | 2016-09-15 |
Attorney, Agent or Firm:
SHANGHAI HENGHUI INTELLECTUAL PROPERTY AGENCY (CN)
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