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Patent Searching and Data


Title:
MICROWAVE SENSOR AND MICROWAVE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2016/042886
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a microwave sensor and microwave measurement method that are capable of highly accurate measurement over a wide dynamic range and have low susceptibility to the influence of vibration, temperature fluctuation, and the like. In a microwave sensor according to the present invention, stability is improved through the removal of a DC component (central optical frequency) of a microwave modulated optical signal not at an OE conversion site as in fig. 7 but at an antenna site using a monolithic EO chip. Additionally, the present invention makes optimization of DC component removal possible through the adjustment of a variable resistor connected in series to an EAM.

Inventors:
ISHIBASHI, Tadao (1-32 Shin-Urashimacho 1-chome, Kanagawa-ku, Yokohama-sh, Kanagawa 31, 〒2210031, JP)
ITOH, Hiroki (1-32 Shin-Urashimacho 1-chome, Kanagawa-ku, Yokohama-sh, Kanagawa 31, 〒2210031, JP)
SHIMIZU, Makoto (1-32 Shin-Urashimacho 1-chome, Kanagawa-ku, Yokohama-sh, Kanagawa 31, 〒2210031, JP)
Application Number:
JP2015/069395
Publication Date:
March 24, 2016
Filing Date:
July 06, 2015
Export Citation:
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Assignee:
NTT ELECTRONICS CORPORATION (1-32, Shin-Urashimacho 1-chome Kanagawa-ku, Yokohama-sh, Kanagawa 31, 〒2210031, JP)
International Classes:
G01R29/08; G02F1/015; G02F1/025
Foreign References:
JPH09113557A1997-05-02
JP2012215662A2012-11-08
JP2008526049A2008-07-17
JPH11194146A1999-07-21
JP2008107272A2008-05-08
Attorney, Agent or Firm:
OKADA, Kenji et al. (I'LL, Setoguchi Bldg. 3rd fl. 12-5, Nishi-Shimbashi 2-chom, Minato-ku Tokyo 03, 〒1050003, JP)
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