MICROWIRE TEMPERATURE SENSORS CONSTRUCTED TO ELIMINATE STRESS-RELATED TEMPERATURE MEASUREMENT INACCURACIES AND METHOD OF MANUFACTURING SAID SENSORS

Title:

MICROWIRE TEMPERATURE SENSORS CONSTRUCTED TO ELIMINATE STRESS-RELATED TEMPERATURE MEASUREMENT INACCURACIES AND METHOD OF MANUFACTURING SAID SENSORS

Document Type and Number:

WIPO Patent Application WO/2012/122258

Kind Code:

A3

Abstract:

Improved, highly accurate microwire sensors (10) include a microwire assembly (14) including at least one primary, temperature-sensing microwire (16) encased within a closed-ended, stress-absorbing protective tube (12). Preferably, the sensor assembly (14) includes a plurality of microwires, e.g., a primary temperature-sensing microwire (16), a reference microwire (18), and a calibration microwire (20). The sensors (10) may be embedded within a heat-treatable or curable material (24) to monitor the temperature of the material (24) over a selected temperature range, e.g., during a pre- and/or post-curing temperature range. The tube (12) is formed of material which does not appreciably magnetically bias the microwire assembly (14), and substantially prevents forces exerted on the tube (12) from distorting the sensor assembly (14).

Inventors:

CLOTHIER BRIAN L (US)

Application Number:

PCT/US2012/028058

Publication Date:

December 13, 2012

Filing Date:

March 07, 2012

Export Citation:

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Assignee:

TSI TECHNOLOGIES LLC (US)
CLOTHIER BRIAN L (US)

International Classes:

G01K7/36; G01K1/08; G01K7/38

Domestic Patent References:

WO2010151453A2

2010-12-29

Foreign References:

US7736052B2	2010-06-15
US20100006562A1	2010-01-14
US7794142B2	2010-09-14

Other References: