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Title:
MILLIMETER WAVE HOLOGRAPHIC THREE-DIMENSIONAL IMAGING DETECTION SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2017/113465
Kind Code:
A1
Abstract:
A millimeter wave holographic three-dimensional imaging detection system comprises: a emission antenna (14) configured to emit a millimeter wave emission signal to a detection target (24); a receiving antenna (15) configured to receive an echo signal returned from the detection target (24); a millimeter wave transceiving module (11) configured to generate the millimeter wave emission signal to be emitted to the detection target (24) and receive and process the echo signal from the receiving antenna (15); a scanning apparatus (10) configured to support the millimeter wave transceiving module (11), the emission antenna (14) and the receiving antenna (15), and move the millimeter wave transceiving module (11), the emission antenna (14) and the receiving antenna (15) according to a preset trajectory so as to scan the detection target (24) utilizing millimeter waves; a data acquisition and processing module (12) configured to acquire and process the echo signal output from the millimeter wave transceiving module to generate a three-dimensional image of the detection target (24); and an image displaying unit (13) configured to display the three-dimensional image generated by the data acquisition and processing module (12). The millimeter wave holographic three-dimensional imaging detection system has the advantages of simple structure, high resolution, quick imaging time, relatively large field of view, and the like. Also provided is a method for performing a millimeter wave three-dimensional holographic imaging detection of a detection target (24) with the millimeter wave holographic three-dimensional imaging detection system.

Inventors:
QI CHUNCHAO (CN)
ZHAO SHUKAI (CN)
JIA CHENGYAN (CN)
WU GUANGSHENG (CN)
DING QING (CN)
LIU JUNCHENG (CN)
LIU BEIBEI (CN)
ZHANG YANDONG (CN)
LIU YANLI (CN)
Application Number:
PCT/CN2016/072411
Publication Date:
July 06, 2017
Filing Date:
January 27, 2016
Export Citation:
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Assignee:
SHENZHEN INST OF TERAHERTZ TECH AND INNOVATION (CN)
SHENZHEN VICTOOTH TERAHERTZ TECH CO LTD (CN)
International Classes:
G01V3/12; G01S13/89; G01V9/00
Domestic Patent References:
WO2011129342A12011-10-20
Foreign References:
CN102508240A2012-06-20
CN102426361A2012-04-25
CN102508306A2012-06-20
CN102393536A2012-03-28
CN102393537A2012-03-28
CN105699494A2016-06-22
Other References:
See also references of EP 3399332A4
Attorney, Agent or Firm:
BEIJING LAWSING IP FIRM (CN)
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