Title:
MINUTE OBJECT DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/104533
Kind Code:
A1
Abstract:
A minute object detection device (11) is provided with an optical system (50). A first optical system (50) includes a first reflection region (101), a second reflection region (102), and a light-receiving element (6). The first reflection region (101) has an elliptic surface shape, and, using the positions of two focal points on the elliptic surface shape, scattered light formed as a result of irradiated light striking a particle (R) and scattering is reflected and guided to the light-receiving element (6). The second reflection region (102) reflects the scattered light that reaches said region from the particle (R), and guides said light to the first reflection region (101), said light then being guided to the light-receiving element (6) utilizing the elliptic surface shape of the first reflection region (101). The beam diameter of the scattered light reflected by the second reflection region (102) is larger than the particle (R) at the position of the particle (R) where the scattered light was emitted.
Inventors:
NAKAI KENYA (JP)
Application Number:
PCT/JP2016/086550
Publication Date:
June 22, 2017
Filing Date:
December 08, 2016
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01N15/06; G01N21/49
Domestic Patent References:
| WO2007063862A1 | 2007-06-07 | |||
| WO2015073911A1 | 2015-05-21 |
Foreign References:
| JPH07504497A | 1995-05-18 | |||
| JPS61160048A | 1986-07-19 | |||
| JPH09502254A | 1997-03-04 | |||
| JPS56128556U | 1981-09-30 |
Other References:
See also references of EP 3392648A4
Attorney, Agent or Firm:
MURAKAMI, Kanako et al. (JP)
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