Title:
MONITORING DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2022/210061
Kind Code:
A1
Abstract:
The present invention receives specifications of equipment specification information for specifying subject equipment, which is equipment subject to analysis, and an analysis item to be analyzed for the subject equipment, acquires data of a data type required for analyzing the received analysis item, determines a current equipment state of the subject equipment on the basis of the acquired data, calculates a diagnostic score, which is obtained by scoring the current state of the subject equipment, on the basis of the determined equipment state of the subject equipment, determines a diagnostic result of the subject equipment on the basis of the calculated diagnostic score, and visualizes the determined diagnostic result of the subject equipment.
Inventors:
KONO MASASHI (JP)
NAKAGAWA YUUSUKE (JP)
TOTTORI NOBUHIRO (JP)
NAKAGAWA YUUSUKE (JP)
TOTTORI NOBUHIRO (JP)
Application Number:
PCT/JP2022/012908
Publication Date:
October 06, 2022
Filing Date:
March 18, 2022
Export Citation:
Assignee:
HITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD (JP)
International Classes:
G05B23/02
Foreign References:
| JP2020197777A | 2020-12-10 | |||
| JP2019128704A | 2019-08-01 | |||
| JPH02171998A | 1990-07-03 | |||
| JP2012174102A | 2012-09-10 | |||
| JP2019061565A | 2019-04-18 | |||
| JP2018164159A | 2018-10-18 | |||
| JP2014153736A | 2014-08-25 |
Attorney, Agent or Firm:
SUNNEXT INTERNATIONAL PATENT OFFICE (JP)
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