Title:
MONITORING DIAGNOSTIC DEVICE AND MONITORING DIAGNOSTIC METHOD
Document Type and Number:
WIPO Patent Application WO/2011/145496
Kind Code:
A1
Abstract:
An anomaly monitoring processing unit (2) partitions sensor data collected from a device to be monitored (8) into sensor data by a plurality of state modes on the basis of a state mode transition point which has been detected at a state mode transition point detection processing unit (21), and classifies the partitioned sensor data further into a plurality of groups. Then, each of the sensor data are compared with past statistical data for each state mode and group to detect an anomaly thereof. In addition, a cause diagnostic processing unit (3) diagnoses an anomaly cause using a link model for before and after anomaly detection which has been constructed on the basis of a correlation coefficient between sensor data of each group.
Inventors:
TAMAKI Kenji (HITACHI LTD., 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
Application Number:
JP2011/060839
Publication Date:
November 24, 2011
Filing Date:
May 11, 2011
Export Citation:
Assignee:
HITACHI, LTD. (6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo, 80, 〒1008280, JP)
株式会社日立製作所 (〒80 東京都千代田区丸の内一丁目６番６号 Tokyo, 〒1008280, JP)
株式会社日立製作所 (〒80 東京都千代田区丸の内一丁目６番６号 Tokyo, 〒1008280, JP)
International Classes:
G05B23/02; G06Q50/00; G21C17/00
Attorney, Agent or Firm:
ISONO Michizo (Sabo Kaikan Annex,,7-4, Hirakawa-cho 2-chome, Chiyoda-ku Tokyo 93, 〒1020093, JP)
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Claims: