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Title:
MULTI-CHANNEL AUTOMATED TESTING DEVICE AND METHOD FOR OPTICAL WAVEGUIDE CHIP STRIP
Document Type and Number:
WIPO Patent Application WO/2019/061889
Kind Code:
A1
Abstract:
A multi-channel automated testing device for an optical waveguide chip strip. A multi-channel testing system (1) has an input end connected to an automated light source locating system (2) and a first optical path switching system (3) via optical fibers. An output end of the first optical path switching system (3) is connected to an input end of a single-input multi-output beam splitter (5). Output ends of the single-input multi-output beam splitter (5) are connected to input optical fibers of an input-end multi-channel optical fiber array (6). An output-end multi-channel optical fiber array (7) is connected to input ends of a second optical path switching system (4). Output ends of the second optical path switching system (4) are connected to power meters (1-3) of multiple channels of the multi-channel testing system (1) and a fast response detector (PD) (2-2) of the automated light locating system (2), respectively. The present invention reduces complexity of manual operation and improves testing efficiency. In addition, relative consistency of a testing environment is ensured thus preventing additional losses caused by switching an optical path manually. Also provided is a multi-channel automated testing method for an optical waveguide chip strip.

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Inventors:
ZHAO MINGLU (CN)
TAN SHUWEI (CN)
LI LI (CN)
DING LI (CN)
MA WEIDONG (CN)
Application Number:
PCT/CN2017/118172
Publication Date:
April 04, 2019
Filing Date:
December 25, 2017
Export Citation:
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Assignee:
ACCELINK TECH CO LTD (CN)
International Classes:
G01M11/02
Domestic Patent References:
WO2007013128A12007-02-01
Foreign References:
CN101556207A2009-10-14
CN101206155A2008-06-25
CN106153299A2016-11-23
JPH07294380A1995-11-10
Attorney, Agent or Firm:
BEIJING TIAN QI ZHI XIN INTELLECTUAL PROPERTY AGENCY CO., LTD (CN)
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