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Patent Searching and Data


Title:
MUON-BASED NUCLEAR LEVEL SENSING GAUGE
Document Type and Number:
WIPO Patent Application WO/2020/205063
Kind Code:
A3
Abstract:
A disclosed system determines an amount and/or density of material in a container. The system includes a first detector, a second detector, and a processor circuit. The first detector and second detector determine a generally vertical flux of naturally-occurring charged particle entering and exiting the container, respectively. The first and second detectors may include scintillation detectors that detect muons in an energy range of 100-4000 MeV to determine a flux of muons entering the container and exiting the container, respectively. The processor circuit determines a difference in the flux of naturally-occurring charged particles entering the container relative to the flux of charged particles exiting the container. The processor circuit further determines the amount and/or density of material in the container based on the determined flux of charged particles lost by decay in the process materials or vessel walls or deflected from the second detector.

Inventors:
CAHILL BONAVENTURE (US)
Application Number:
PCT/US2020/017414
Publication Date:
December 17, 2020
Filing Date:
February 10, 2020
Export Citation:
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Assignee:
VEGA AMERICAS INC (US)
International Classes:
G01T1/20; G01N9/00
Foreign References:
US20160116630A12016-04-28
US20080315091A12008-12-25
US20150241593A12015-08-27
US20170357026A12017-12-14
Other References:
HALL ET AL.: "A Simplified Muon Lifetime Experiment for the Instructional Laboratory", AMERICAN JOURNAL OF PHYSICS, vol. 38, no. 10, October 1970 (1970-10-01), pages 1196 - 1200, XP055771289
NISHIYAMA RYUICHI, TAKETA AKIMICHI, MIYAMOTO SEIGO, KASAHARA KATSUAKI: "Monte Carlo simulation for background study of geophysical inspection with cosmic-ray muons", GEOPHYSICAL JOURNAL INTEMATIONAL, vol. 206, no. Issue 2, August 2016 (2016-08-01), pages 1039 - 1050, XP055771291, DOI: 10.1093/gji/ggw191
Attorney, Agent or Firm:
HUMPHREY, Thomas, W. et al. (US)
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