Title:
NEAR-FIELD MEASUREMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/013820
Kind Code:
A1
Abstract:
The present invention relates to a near-field measurement system for measuring the output of an antenna through a scanner, the system comprising: a signal analysis unit for generating a low-frequency signal for measurement of the output of the antenna, receiving a low-frequency signal converted by a down-converter, and analyzing signal information from an output signal of the antenna; an up-converter for frequency-converting a low-frequency signal generated by the signal analyzing unit to transmit a high-frequency signal to the antenna; a probe which is coupled to the scanner to move and receive a high-frequency output signal of the antenna; and the down-converter for frequency-converting a high-frequency output signal of the antenna received by the probe into a low-frequency, wherein antenna near-field measurement is possible at low cost.
Inventors:
JUNG YOUNG-BAE (KR)
Application Number:
PCT/KR2021/015200
Publication Date:
February 09, 2023
Filing Date:
October 27, 2021
Export Citation:
Assignee:
UNIV NAT HANBAT IND ACAD COOP FOUND (KR)
International Classes:
G01R29/10; G01R1/073; G01R23/16; G01R29/08
Foreign References:
| KR101012161B1 | 2011-02-07 | |||
| KR101052045B1 | 2011-07-26 | |||
| KR101337300B1 | 2013-12-05 | |||
| KR20050113772A | 2005-12-05 | |||
| KR20130091393A | 2013-08-19 |
Attorney, Agent or Firm:
LEE, Un Cheol (KR)
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