NOISE LEVEL ESTIMATION METHOD, MEASUREMENT DATA PROCESSING DEVICE, AND PROGRAM FOR MEASUREMENT DATA PROCESSING

Title:

NOISE LEVEL ESTIMATION METHOD, MEASUREMENT DATA PROCESSING DEVICE, AND PROGRAM FOR MEASUREMENT DATA PROCESSING

Document Type and Number:

WIPO Patent Application WO/2016/120959

Kind Code:

A1

Abstract:

In a method for estimating a noise level expressing the size of a noise component from measurement data, each area of consecutive positive values and area of consecutive negative values in first waveform data obtained by extracting a high-frequency noise component from assumed noise data is made to be a single segment (step S3); a segment width threshold is determined on the basis of the distribution of the widths of the plurality of segments dividing the first waveform data (step S4); second waveform data obtained by extracting a high-frequency measurement component from measurement data is divided into a plurality of segments, with each area of consecutive positive values and area of consecutive negative values in the second waveform data being a single segment (step S6); a first segment group is created through the removal of segments having a width exceeding the threshold from the plurality of segments of the second waveform data (step S7); and a noise level is determined on the basis of the height or area of the plurality of segments included in the first segment group (step S12).

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Inventors:

KOZAWA HIROAKI (JP)

Application Number:

PCT/JP2015/051973

Publication Date:

August 04, 2016

Filing Date:

January 26, 2015

Export Citation:

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Assignee:

SHIMADZU CORP (JP)

International Classes:

G01N30/86

Foreign References:

JP2009008582A	2009-01-15
JPH11153588A	1999-06-08

Other References: