Title:
NON-CONTACT DISCHARGE EVALUATION METHOD AND NON-CONTACT DISCHARGE EVALUATION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2013/111445
Kind Code:
A1
Abstract:
In the present invention, level (charge quantity) and energy of discharge are evaluated by obtaining the level and the energy by means of optical measurement on the basis of light emission. A discharge source is made to generate discharge emission by applying a voltage to the discharge source from a known power supply, an intensity waveform of the discharge emission is measured using a light receiving element, and at the same time, a discharge current waveform is measured by means of a current conversion probe and a current waveform detector, and a database is generated, said database having recorded therein, considering applied power supply information, relationships with analysis data obtained by analyzing the waveforms. An intensity waveform of discharge emission generated by means of an apparatus to be measured is measured using the light receiving element, and emission data obtained by analyzing the waveform is compared with the data recorded in the database, thereby estimating the discharge level as a value.
Inventors:
OHTSUKA SHINYA (JP)
FURUKAWA MASAAKI (JP)
YAMAGUCHI YUKI (JP)
FURUKAWA MASAAKI (JP)
YAMAGUCHI YUKI (JP)
Application Number:
PCT/JP2012/080816
Publication Date:
August 01, 2013
Filing Date:
November 29, 2012
Export Citation:
Assignee:
KYUSHU INST TECHNOLOGY (JP)
International Classes:
G01N21/67; G01R31/00; G01R31/12; H01T15/00
Foreign References:
| JP2010101671A | 2010-05-06 | |||
| JP2011099775A | 2011-05-19 | |||
| JP2008268083A | 2008-11-06 | |||
| JP2008304357A | 2008-12-18 | |||
| JP2010204067A | 2010-09-16 | |||
| JP2707823B2 | 1998-02-04 |
Other References:
RYUICHI ISHINO: "Hoden Bubun no Hakko Menseki o Mochiita More Denryu Suitei Shuho no Kaihatsu (sono 2) -Shiryohen no Sokutei Kekka ni Motozuku Haiden'yo Kobunshi Gaishi no More Denryu Suitei", CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY, SYSTEM ENGINEER RESEARCH LABORATORY KENKYU HOKOKU, vol. R05008, May 2006 (2006-05-01), XP008174459
BENDJAMIN J ET AL.: "Remote Sensing of ESD through Optical and Magnetic Radiation Fields", IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, vol. 6, no. 6, December 1999 (1999-12-01), pages 896 - 899, XP055081091
BENDJAMIN J ET AL.: "Remote Sensing of ESD through Optical and Magnetic Radiation Fields", IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, vol. 6, no. 6, December 1999 (1999-12-01), pages 896 - 899, XP055081091
Attorney, Agent or Firm:
OHKAWA, Yuzuru (JP)
Okawa 譲 (JP)
Okawa 譲 (JP)
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Claims: