NON-CONTACT DISCHARGE TEST METHOD AND DEVICE

WIPO Patent Application WO/2014/112257

A1

Weak emitted light is detected and a light emission intensity waveform is processed to thereby evaluate discharge energy in a non-contact discharge test carried out in a poor electromagnetic noise environment. Voltage and electric current are applied to an object to be measured to thereby measure light emission intensity waveforms in which light is emitted by discharge using a light emission measurement device, electric current waveforms of the discharge are measured at the same time using an electric current measurement device, and a database is created in which a record of the relationship with analysis data obtained by analyzing the waveforms is recorded on the basis of application power source information applied to the object to be measured. The intensity waveform of light emitted by discharge generated from the object to be measured is measured with reference to the electromagnetic waves generated by discharge of an object to be measured. The light emission data obtained by analyzing the intensity waveform is compared with the data recorded in the database to thereby estimate the magnitude of discharge as a value.

OHTSUKA SHINYA (JP)
YAMAGUCHI YUKI (JP)
TSUBATA HIROYUKI (JP)

PCT/JP2013/083320

July 24, 2014

December 12, 2013

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KYUSHU INST TECHNOLOGY (JP)

G01R31/12; G01N21/67; G01R31/00; G01R31/50

JP2006038471A	2006-02-09
JPS6386592A	1988-04-16
JP2009300357A	2009-12-24
JPH0586841A	1993-04-06
JP2012154880A	2012-08-16
JP2012242307A	2012-12-10

OHKAWA, Yuzuru (JP)
Okawa 譲 (JP)

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