Title:
NON-DESTRUCTIVE DETECTION METHOD OF CHARGED PARTICLES WITHOUT MASS LIMITATION
Document Type and Number:
WIPO Patent Application WO/2016/046396
Kind Code:
A3
Abstract:
According to an aspect of the invention, there is provided a non-destructive method (1) for detecting charged particles comprising the steps of: - measuring (st00) a reference value of at least one physical parameter of an ion cloud confined in an ion trap; - performing (st10) an injection of a sample in the ion cloud confined in the ion trap, the sample crossing the ion cloud and getting out the ion cloud without being trapped inside the ion trap; - measuring (st20) a first experimental value of the at least one physical parameter of the ion cloud; - comparing (st30) the first experimental value with the reference value in order to determine the presence of at least one charged particle in the sample, or the absence of any charged particle in the sample.
Inventors:
CHAMPENOIS CAROLINE ANTOINETTE MADELEINE (FR)
HILICO LAURENT (FR)
JOUVET CHRISTOPHE MICHEL RENÉ (FR)
PEDREGOSA GUTIERREZ JOFRE (FR)
KNOOP MARTINA (FR)
DEDONDER-LARDEUX CLAUDE (FR)
HILICO LAURENT (FR)
JOUVET CHRISTOPHE MICHEL RENÉ (FR)
PEDREGOSA GUTIERREZ JOFRE (FR)
KNOOP MARTINA (FR)
DEDONDER-LARDEUX CLAUDE (FR)
Application Number:
PCT/EP2015/072165
Publication Date:
May 19, 2016
Filing Date:
September 25, 2015
Export Citation:
Assignee:
CENTRE NAT RECH SCIENT (FR)
UNIV AIX MARSEILLE (FR)
UNIV AIX MARSEILLE (FR)
International Classes:
G01N21/64; H01J49/02
Foreign References:
| US5770857A | 1998-06-23 | |||
| US5591969A | 1997-01-07 |
Other References:
Y. CAI ET AL: "Optical Detection and Charge-State Analysis of MALDI-Generated Particles with Molecular Masses Larger Than 5 MDa", ANALYTICAL CHEMISTRY, vol. 74, no. 17, 1 September 2002 (2002-09-01), pages 4434 - 4440, XP055172596, ISSN: 0003-2700, DOI: 10.1021/ac020205l
Attorney, Agent or Firm:
LEBKIRI, Alexandre (25 rue de Maubeuge, Paris, FR)
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