Title:
NON-DESTRUCTIVE INSPECTION DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2017/043581
Kind Code:
A1
Abstract:
A non-destructive inspection device 10 in which back scattering of neutrons is utilized is provided with a neutron source 3 for emitting pulse neutron rays onto a surface 1a of an object to be examined 1, a neutron detecting device 5 for detecting scattered neutrons that have returned after scattering by the object to be examined 1, and a measurement device 7 for generating detection frequency data for measuring the frequency with which neutrons that have returned after scattering are detected by the neutron detecting device 5 and representing the detection frequency with respect to time.
Inventors:
OTAKE YOSHIE (JP)
IKEDA YOSHIMASA (JP)
IKEDA YOSHIMASA (JP)
Application Number:
PCT/JP2016/076470
Publication Date:
March 16, 2017
Filing Date:
September 08, 2016
Export Citation:
Assignee:
RIKEN (JP)
International Classes:
G01N23/204
Foreign References:
| JP2008180700A | 2008-08-07 | |||
| JP2010175362A | 2010-08-12 | |||
| JPH10185843A | 1998-07-14 |
Attorney, Agent or Firm:
HOTTA Minoru (JP)
Download PDF: