NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SYSTEM

WIPO Patent Application WO/2022/250038

A1

This non-destructive inspection system 1 has a non-destructive inspection device 2 and a management device 3. The non-destructive inspection device 2 is provided with: a neutron emission unit 10 capable of emitting a neutron beam; a gamma ray detection unit 20 capable of detecting gamma rays; a device casing 30 covering the neutron emission unit 10 and the gamma ray detection unit 20, an opening 30a being formed in the device casing 30; an outer shutter 31 that opens/closes the opening 30a; dose monitors 51, 52, 53 provided to the device casing 30, the dose monitors 51, 52, 53 detecting the radiation dose; a device communication unit 56 capable of transmitting device information including the detected radiation dose to the management device 3, and capable of receiving inspection permission information from the management device 3; and a device control unit 40 that, when the inspection permission information is acquired, opens the outer shutter 31 and enables emission of a neutron beam from the neutron emission unit 10.

NAGANO SHIGENORI (JP)
YANOBE SATOSHI (JP)
YAJIMA AKIRA (JP)
AIKOH HANAKO (JP)
ISHIGURO SATORU (JP)
OTAKE YOSHIE (JP)
WAKABAYASHI YASUO (JP)
TAKAMURA MASATO (JP)

PCT/JP2022/021197

December 01, 2022

May 24, 2022

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TOPCON CORP (JP)
RIKEN (JP)

G01N23/22

WO2019198260A1

2019-10-17

JP2001194324A	2001-07-19
JP2016525687A	2016-08-25
JP2010217020A	2010-09-30
JP2015203648A	2015-11-16
CN201664703U	2010-12-08
KR20090061842A	2009-06-17

MAEKAWA Naoki (JP)

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