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Title:
NON-DESTRUCTIVE INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2015/064723
Kind Code:
A1
Abstract:
The present invention provides a technology that can perform precision non-destructive inspection of a moving subject. A radiation source (1) radiates radioactive rays toward gratings (G0-G2). Each grating (G0-G2) is provided with a plurality of grating members. A radioactive ray detecting apparatus (3) detects radioactive rays that are diffracted by the plurality of grating members. The plurality of grating members are arranged to have a predetermined phase difference such that there is a mutual phase difference between Moiré pattern images that are respectively formed by the radioactive rays that pass through first to third partial regions (71-73).

Inventors:
MOMOSE ATSUSHI (JP)
Application Number:
PCT/JP2014/078994
Publication Date:
May 07, 2015
Filing Date:
October 30, 2014
Export Citation:
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Assignee:
UNIV TOHOKU (JP)
International Classes:
G01N23/20
Domestic Patent References:
WO2004058070A12004-07-15
Foreign References:
JP2013529984A2013-07-25
JP2012085995A2012-05-10
JP2008545981A2008-12-18
US20100074395A12010-03-25
US5812629A1998-09-22
JP2008145111A2008-06-26
JP2009240378A2009-10-22
JP2012016370A2012-01-26
Other References:
ATSUSHI MOMOSE: "X-ray phase imaging based on Talbot effect", JOURNAL OF THE JAPANESE SOCIETY FOR SYNCHROTRON RADIATION RESEARCH, vol. 23, no. 6, 30 November 2010 (2010-11-30), pages 382 - 392, XP055295296
F. PFEIFFER ET AL., NAT. PHYS., vol. 2, 2006, pages 258 - 261
A. MOMOSE; S. KAWAMOTO; I. KOYAMA; Y. HAMAISHI; K. TAKAI; Y. SUZUKI: "Demonstration of X-ray Talbot interferometry", JPN. J. APPL. PHYS., vol. 42, 2003, pages L866 - L868
M. TAKEDA; H. INA; S. KOBAYASHI: "Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry", J. OPT. SOC. AM., vol. 72, 1982, pages 156 - 160, XP000570893, DOI: doi:10.1364/JOSA.72.000156
ATSUSHI MOMOSE; WATARU YASHIRO; HIROHIDE MAIKUSA; YOSHIHIRO TAKEDA: "High-speed X-ray phase imaging and X-ray phase tomography with Talbot interferometer and white synchrotron radiation", OPT. EXPRESS, vol. 17, 2009, pages 12540 - 12545
Attorney, Agent or Firm:
NARUSE, SHIGEO (JP)
Shigeo Naruse (JP)
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