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Title:
NON-DESTRUCTIVE INSPECTION METHOD, NON-DESTRUCTIVE INSPECTION SYSTEM, AND NON-DESTRUCTIVE INSPECTION CONTROL APPARATUS
Document Type and Number:
WIPO Patent Application WO/2013/085075
Kind Code:
A1
Abstract:
A non-destructive inspection system (100) sets to a predetermined position a workpiece (1) having an overlapping juncture of dissimilar metal materials that must be inspected with a handling robot (11). The surface of the overlapping juncture is irradiated in a predetermined waveform with a laser light of a previously set waveform from a laser light emission unit (2); an image is captured by an infrared camera (3), and a data processing device (4) acquires an infrared image. The data processing device (4) runs a Fourier transform for every pixel of the infrared image on the basis of the acquired infrared image, and a phase image is generated by a console device (5). On the basis of the generated phase image, the console device (5) determines whether or not a region of greater phase delay than a previously set predetermined determination value is present in the overlapping juncture.

Inventors:
YAHABA TAKANORI (JP)
KOBAYASHI TSUTOMU (JP)
TAKAO KUNIHIKO (JP)
Application Number:
PCT/JP2012/082433
Publication Date:
June 13, 2013
Filing Date:
December 07, 2012
Export Citation:
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Assignee:
HONDA MOTOR CO LTD (JP)
KEN AUTOMATION CO LTD (JP)
International Classes:
G01N25/72; B23K20/12; B23K31/00; B23K103/20
Domestic Patent References:
WO2007116629A12007-10-18
Foreign References:
JP2011247735A2011-12-08
JP2010513883A2010-04-30
JP2008023583A2008-02-07
JP2002082060A2002-03-22
JP2010531984A2010-09-30
JPH02201149A1990-08-09
Attorney, Agent or Firm:
ISONO Michizo (JP)
Michizo Isono (JP)
Download PDF:
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Claims:



 
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