NON-DESTRUCTIVE INSPECTION METHOD

WIPO Patent Application WO/2019/059012

A1

The purpose of the present invention is to simply and accurately set the positions on an object to be inspected which are identified in detection results of each of a plurality of different types of non-destructive inspection means, when inspecting the object to be inspected using the plurality of different types of non-destructive inspection means. Marking positions on an object to be inspected in detection results (fig. 1A) from one non-destructive inspection means among a plurality of non-destructive inspection means are determined and stored in a device. Marks m1, m2, m3 on the object 1 to be inspected which correspond to the marking positions, and which are capable of being detected by the other non-destructive inspection means are fixedly formed (fig. 1B), the object to be inspected including the marks is subsequently detected by the other non-destructive inspection means, and the detection results from the plurality of non-destructive inspection means are compared using the marks, i.e. the marking positions, as references.

IMADA MASAHIRO (JP)
HATANO TAKUJI (JP)
SEKINE KOUJIROU (JP)
TSUCHIDA MASAAKI (JP)
YAGI TSUKASA (JP)

PCT/JP2018/033347

March 28, 2019

September 10, 2018

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KONICA MINOLTA INC (JP)

G01N23/041; G01J5/48; G01N3/40; G01N27/83; H01M10/04

JP2005003542A	2005-01-06
JP2002310954A	2002-10-23
JP2007315834A	2007-12-06
JP2008235054A	2008-10-02
JP2016017823A	2016-02-01
DE102012215120A1	2014-02-27

KOYO INTERNATIONAL PATENT FIRM (JP)

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