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Title:
NONDESTRUCTIVE INSPECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2001/033920
Kind Code:
A1
Abstract:
A nondestructive inspection apparatus with integrated power supply comprises a molded power supply section (14) having a resin-molded high voltage (e.g. 160 kV) generating section (15) secured to the base of a tubular section (2). The durability and handlability are improved by omitting a high voltage cable. Since the high voltage generating section (15) is confined in a molding resin, the degree of freedom in the arrangement of the high voltage generating section (15) within the mold is enhanced significantly. Furthermore, an X-ray generating unit (1) can be installed stably in the nondestructive inspection apparatus (70) by disposing the heavy molded power supply section (14) under a target (10).

Inventors:
OCHIAI YUTAKA (JP)
Application Number:
PCT/JP2000/007561
Publication Date:
May 10, 2001
Filing Date:
October 27, 2000
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS KK (JP)
OCHIAI YUTAKA (JP)
International Classes:
H05G1/08; G01N23/04; G21K5/02; H01J3/02; H01J35/02; H01J35/06; H01J35/14; H05G1/00; H05G1/02; H05G1/06; H05G1/10; (IPC1-7): H05G1/00
Foreign References:
JPH06188092A1994-07-08
JPH1039097A1998-02-13
JPS5814499A1983-01-27
JPH08162285A1996-06-21
Other References:
See also references of EP 1233659A4
Attorney, Agent or Firm:
Hasegawa, Yoshiki (Soei Patent and Law Firm, Okura-honkan 6-12, Ginza 2-chom, Chuo-ku Tokyo, 104-0061, JP)
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