Title:
NONLINEAR OPTICAL MICROSCOPE AND NONLINEAR OPTICAL MICROSCOPY
Document Type and Number:
WIPO Patent Application WO/2012/127907
Kind Code:
A1
Abstract:
A nonlinear optical microscope for measuring signal light generated from a nonlinear optical process due to a plurality of excitation rays of light, wherein the center of gravity of a light collection point of the plurality of excitation rays of light is position-modulated at a predetermined frequency, and a frequency component corresponding to the modulation frequency is extracted from the signal light. The frequency component to be extracted is preferably an even multiple of the modulation frequency. Moreover, as a position modulation method, a method for linearly or spirally moving the center of gravity of the light collection point within a plane perpendicular to a light axis, or linearly moving the center of gravity of the light collection point in a light axis direction is preferable.
Inventors:
ISOBE KEISUKE (JP)
MIDORIKAWA KATSUMI (JP)
MIDORIKAWA KATSUMI (JP)
Application Number:
PCT/JP2012/052377
Publication Date:
September 27, 2012
Filing Date:
February 02, 2012
Export Citation:
Assignee:
RIKEN (JP)
ISOBE KEISUKE (JP)
MIDORIKAWA KATSUMI (JP)
ISOBE KEISUKE (JP)
MIDORIKAWA KATSUMI (JP)
International Classes:
G02B21/00; G01N21/64
Foreign References:
| JP2005091895A | 2005-04-07 | |||
| JP2010286799A | 2010-12-24 | |||
| JP2010532878A | 2010-10-14 |
Attorney, Agent or Firm:
KAWAGUCHI, Yoshiyuki et al. (JP)
Yoshiyuki Kawaguchi (JP)
Yoshiyuki Kawaguchi (JP)
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Claims: