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Patent Searching and Data


Title:
OBJECT DETECTION DEVICE AND OBJECT DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/116518
Kind Code:
A1
Abstract:
On the basis of measurement information expressing measurement range information regularly or irregularly measured by a measurement device, this object detection device regularly or irregularly acquires measurement results for one or more objects using a measurement parameter group of one or more measurement parameters. Upon acquiring the measurement results, the object detection device uses the measurement results to generate one or more measurement models expressed by the measurement results and acquires one or more estimation models estimated for the measurement range. The object detection device selects a measurement model and estimation model to compare from among the one or more generated measurement models and one or more acquired estimation models and changes the measurement parameter group on the basis of the results of comparing the selected measurement model and estimation model.

Inventors:
SASATANI SO (JP)
KUME HIDEYUKI (JP)
MIKI RYOSUKE (JP)
ITOH MASAYA (JP)
Application Number:
PCT/JP2017/044965
Publication Date:
June 20, 2019
Filing Date:
December 14, 2017
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G01B21/00; G01B11/00
Domestic Patent References:
WO2013031092A12013-03-07
WO2009113231A12009-09-17
Foreign References:
JP2011044046A2011-03-03
JP2017102838A2017-06-08
JP2013114500A2013-06-10
US20120120241A12012-05-17
Attorney, Agent or Firm:
SUNNEXT INTERNATIONAL PATENT OFFICE (JP)
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