Title:
OBJECT INSPECTION APPARATUS AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2017/094456
Kind Code:
A1
Abstract:
The present invention provides an object inspection apparatus and an object inspection method such that it is possible to perform object inspection with high accuracy in a short time. The object inspection apparatus (300) according to an embodiment of the present invention comprises: a captured image acquisition unit (336); a specifying unit (345) that specifies the positional relation between a camera and an object at the time of capturing the captured image, and the image capture angle of the camera with respect to the object; a generating unit (342) that generates a correct model image, corresponding to the specified positional relation and image capture angle, of the object based on design information; a display unit that superimposes and displays the captured image and the correct model image; a correction instruction reception unit (341) that receives a correction instruction for at least one of the captured image and the correct model image displayed in the display unit; and a collation result reception unit (337) that receives a collation result indicating whether or not the corrected captured image and correct model image match.
Inventors:
HAYASHI DAISUKE (JP)
Application Number:
PCT/JP2016/083124
Publication Date:
June 08, 2017
Filing Date:
November 08, 2016
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G01N21/84; E04G21/12
Foreign References:
| JP2010108384A | 2010-05-13 | |||
| JP2002073730A | 2002-03-12 | |||
| JP2012021323A | 2012-02-02 | |||
| JPH05296723A | 1993-11-09 | |||
| JP2010266202A | 2010-11-25 | |||
| JPH0888825A | 1996-04-02 |
Attorney, Agent or Firm:
MATSUURA, Kenzo (JP)
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