OBJECTIVE OPTICAL SYSTEM FOR ATR MEASUREMENT

Title:

OBJECTIVE OPTICAL SYSTEM FOR ATR MEASUREMENT

Document Type and Number:

WIPO Patent Application WO/2016/110935

Kind Code:

A1

Abstract:

Provided is an objective optical system that has a convex secondary mirror (112) for reflecting measurement light irradiated from an infrared microscope, a concave primary mirror (111) for reflecting the measurement light reflected by the secondary mirror, and a prism (138) on which the measurement light reflected by the primary mirror is irradiated, and that is attached to the infrared microscope and is used for sample surface analysis using the attenuated total reflectance method, wherein a light blocking means (140) for blocking a portion of the light beam of the measurement light is provided on the measurement light optical path between the primary mirror and prism. As a result of this configuration, even if there is not sufficient space on the front side of the secondary mirror, it is possible to adjust the angle of incidence of the measurement light incident on the prism and sample, easily switch between measurement prioritizing optical throughput and measurement prioritizing mitigating anomalous dispersion using a single objective optical system, and easily acquire a plurality of absorption spectrums measured at different penetration depths.

Inventors:

UEDA ATSUSHI (JP)

Application Number:

PCT/JP2015/050051

Publication Date:

July 14, 2016

Filing Date:

January 05, 2015

Export Citation:

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Assignee:

SHIMADZU CORP (JP)

International Classes:

G01N21/552

Foreign References:

JPH0712717A	1995-01-17
JPH063262A	1994-01-11

Other References: