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Patent Searching and Data


Title:
ONLINE TUBE WALL THICKNESS MONITORING INSTRUMENT, SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2018/157731
Kind Code:
A1
Abstract:
An online tube wall thickness monitoring instrument, system and method. The online tube wall thickness monitoring instrument comprises a terahertz generation apparatus and a terahertz receiving apparatus. The terahertz generation apparatus is used for producing terahertz detection waves and transmitting same to a tube wall (30) to be monitored, and the terahertz receiving apparatus is used for receiving the terahertz detection waves passing through the tube wall (30) to be monitored, so as to acquire the thickness of the tube wall (30) to be monitored according to an attenuation occurring to the terahertz detection waves after passing through the tube wall (30) to be monitored. During the detection of the thickness of the tube wall (30), the terahertz generation apparatus arranged therein emits the terahertz detection waves and enables same to be incident on the tube wall (30) to be monitored, and the terahertz detection waves attenuate when passing through the tube wall (30) to be monitored. The terahertz receiving apparatus detects a change in the terahertz detection waves, and thus can obtain the thickness of the tube wall (30) to be monitored. The online tube wall thickness monitoring instrument can realise the rapid and accurate detection of the thickness of a tube wall without the need to make contact with the tube wall.

Inventors:
TAN YIDONG (CN)
PAN YI (CN)
LI CHEN (CN)
DING QING (CN)
Application Number:
PCT/CN2018/076246
Publication Date:
September 07, 2018
Filing Date:
February 11, 2018
Export Citation:
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Assignee:
CHINA COMMUNICATION TECH CO LTD (CN)
SHENZHEN INST TERAHERTZ TECH & INNOVATION (CN)
International Classes:
G01B11/06
Foreign References:
CN106767462A2017-05-31
CN206504707U2017-09-19
CN104864817A2015-08-26
US20140061475A12014-03-06
CN106441119A2017-02-22
US20170003116A12017-01-05
CN104169677A2014-11-26
Other References:
J EN, CHIH YU^: "Sample Thickness Measurement with THz-TDS:Resolution and Implications", J. INFRARED MILLI TERAHZ WAVES, vol. 35, no. 10, 16 July 2014 (2014-07-16), pages 840 - 859, XP055537889
Attorney, Agent or Firm:
ADVANCE CHINA IP LAW OFFICE (CN)
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