Title:
OPTICAL CHARACTERISTIC MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/195573
Kind Code:
A1
Abstract:
An optical characteristic measuring device according to the present invention is provided with: an optical characteristic measuring unit which has a measurement opening and which uses a plurality of optical systems having mutually different geometries to measure a plurality of mutually different optical characteristics of a measured object that faces into the measurement opening; a measured object observation unit for directly observing the measured object facing into the measurement opening; and an observation light source which illuminates the measured object facing into the measurement opening.
Inventors:
TAKEBE YOSUKE (JP)
NOBUMOTO YUSHI (JP)
KAWANO TOSHIO (JP)
NOBUMOTO YUSHI (JP)
KAWANO TOSHIO (JP)
Application Number:
PCT/JP2017/016063
Publication Date:
November 16, 2017
Filing Date:
April 21, 2017
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01J3/50; G01N21/57
Domestic Patent References:
| WO2015178142A1 | 2015-11-26 | |||
| WO2004036162A1 | 2004-04-29 |
Foreign References:
| JPH058448U | 1993-02-05 | |||
| JP2002267600A | 2002-09-18 | |||
| JP2006145374A | 2006-06-08 | |||
| JP2015224881A | 2015-12-14 | |||
| JP2007279052A | 2007-10-25 |
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
Download PDF:
Previous Patent: CERAMIC ELECTRONIC COMPONENT
Next Patent: POLYIMIDE RESIN AND POLYIMIDE RESIN COMPOSITION
Next Patent: POLYIMIDE RESIN AND POLYIMIDE RESIN COMPOSITION