OPTICAL COMPONENT INSPECTING APPARATUS

WIPO Patent Application WO/2013/114778

A1

An optical component inspecting apparatus (100) inspects defects of a plurality of optical components held by means of a pallet (10). The optical component inspecting apparatus is provided with: an image pickup apparatus (40) that has an illuminating apparatus (41), which irradiates optical components (K) with light, said optical components being held by means of the pallet (10), and a camera apparatus (42), which picks up image of respective optical components (K) irradiated with light by means of the illuminating apparatus (41); a moving apparatus (50), which moves the image pickup apparatus (40) parallel to an upper surface of the pallet (10); and an image pickup control means, which picks up the images of the optical components (K), while moving the image pickup apparatus (40) by means of the moving apparatus (50) with respect to the pallet (10) in the stationary state at a predetermined position. Consequently, in the cases of inspecting defects of the optical components held by means of the pallet, positional shifts of the optical components are not generated, and generation of inspection accuracy fluctuation can be eliminated.

SEKI HIROHIKO (JP)
YUZE AKIRA (JP)

PCT/JP2012/083777

August 08, 2013

December 27, 2012

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KONICA MINOLTA INC (JP)
SEKI HIROHIKO (JP)
YUZE AKIRA (JP)

G01N21/958; G01M11/00

JPH085574A	1996-01-12
JP2000266691A	2000-09-29
JP2009288121A	2009-12-10
JP2011127993A	2011-06-30
JP2009243975A	2009-10-22

KOYO INTERNATIONAL PATENT FIRM (JP)
Patent business corporation Mitsuaki international patent firm (JP)

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