Title:
OPTICAL FILM DEFECT DETECTION DEVICE AND OPTICAL FILM DEFECT DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/022551
Kind Code:
A1
Abstract:
The present invention provides an optical film defect detection device and an optical film defect detection method which can easily detect a defect in an optical film. The optical film defect detection device comprises: a light irradiation unit for irradiating light; a reflection unit for guiding light to an optical film by reflecting light irradiated from the light irradiation unit; a screen for displaying a projected shape, which is a projection of a defect in the optical film, as light is projected onto the optical film; and an imaging unit for capturing the image of the projected shape displayed on the screen.
Inventors:
KIM HO JIN (KR)
YANG MYOUNG GON (KR)
CHOI HANG SUK (KR)
JANG EUNG JIN (KR)
YANG MYOUNG GON (KR)
CHOI HANG SUK (KR)
JANG EUNG JIN (KR)
Application Number:
PCT/KR2018/008511
Publication Date:
January 31, 2019
Filing Date:
July 27, 2018
Export Citation:
Assignee:
LG CHEMICAL LTD (KR)
International Classes:
G01N21/896; G01N21/88; G01N21/95
Foreign References:
| JP2012078144A | 2012-04-19 | |||
| JP2011085520A | 2011-04-28 | |||
| KR100769326B1 | 2007-10-24 | |||
| JP2011145082A | 2011-07-28 | |||
| KR20070034928A | 2007-03-29 |
Attorney, Agent or Firm:
PCR INTELLECTUAL PROPERTY LAW FIRM (KR)
Download PDF: