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Patent Searching and Data


Title:
OPTICAL INSPECTING DEVICE AND OPTICAL INSPECTING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/056257
Kind Code:
A1
Abstract:
This optical inspecting device generates a processed image by subjecting a transmission image obtained by causing light to pass through an object to image processing using an image processing algorithm, and inspects the object on the basis of the processed image. The optical inspecting device is provided with: a storage unit which stores in advance a plurality of image processing algorithms; a setting unit which sets at least one of the plurality of image processing algorithms stored in the storage unit as an image processing algorithm to be used for image processing during the inspection; and an aggregating unit which aggregates the image processing algorithms set by the setting unit. The setting unit includes a selecting unit which selects a plurality of image processing algorithm candidates, which are candidates of the image processing algorithm to be set, from among the plurality of image processing algorithms stored in the storage unit, on the basis of the result of the aggregation performed by the aggregating unit.

Inventors:
IWAI ATSUSHI (JP)
SUHARA KAZUHIRO (JP)
Application Number:
JP2017/033693
Publication Date:
March 29, 2018
Filing Date:
September 19, 2017
Export Citation:
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Assignee:
ISHIDA SEISAKUSHO (?6068392, JP)
International Classes:
G01N23/04; G01N23/083; G01N23/18
Domestic Patent References:
WO2016136670A12016-09-01
Foreign References:
JP2012137387A2012-07-19
JP2015141029A2015-08-03
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (SOEI PATENT AND LAW FIRM, Marunouchi MY PLAZA 9th fl. 1-1, Marunouchi 2-chome, Chiyoda-k, Tokyo 05, 〒1000005, JP)
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