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Patent Searching and Data


Title:
OPTICAL INSPECTION APPARATUS AND OPTICAL INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/024159
Kind Code:
A1
Abstract:
An optical inspection apparatus and an optical inspection method, the optical inspection apparatus (100) comprising: a first detection device (10), comprising a first display device (11) and a first control device (13), the first control device (13) being connected to the first display device (11), and the first control device (13) being used to control the state of the first display device (11); a second detection device (20), comprising a second display device (21) and a second control device (23), the second control device (23) being connected to the second display device (21), and the second control device (23) being used to control the state of the second display device (21), wherein the first display device (11) is arranged opposite to the second display device (21); and a sensing device (30), used for sensing the movement of a target position and sending signals to the first control device (13) and the second control device (23), the sensing device (30) being arranged between the first detection device (10) and the second detection device (20). With the described optical inspection apparatus (100), personnel configuration may be reduced, and a large amount of motion may be avoided. Furthermore, the automatic switching of light sources may be achieved, and detection interference is reduced.

Inventors:
LEE KUNYUAN (CN)
Application Number:
PCT/CN2017/099858
Publication Date:
February 07, 2019
Filing Date:
August 31, 2017
Export Citation:
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Assignee:
HKC CORP LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)
International Classes:
G01D21/00; G01N21/88
Foreign References:
CN106679726A2017-05-17
CN204190968U2015-03-04
CN204536220U2015-08-05
CN202793334U2013-03-13
US20060119864A12006-06-08
Attorney, Agent or Firm:
CO-HORIZON INTELLECTUAL PROPERTY INC. (CN)
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