Title:
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/189166
Kind Code:
A1
Abstract:
The purpose of the present invention is to suppress reductions in precision of analysis. The optical measurement device according to an embodiment of the present invention comprises: an excitation light source (32) that emits excitation light having a prescribed wavelength; a spectral dispersion optical system (37) that spectrally disperses fluorescence emitted from a specimen that has been irradiated with the excitation light; a solid-state imaging element (34) that comprises a pixel array part (91) in which a plurality of pixels are arrayed in the form of a matrix, the solid-state imaging element detecting a quantity of light for each wavelength band of the fluorescence that has been spectrally dispersed by the spectral dispersion optical system; and a computation unit (100) that, on the basis of a pixel value acquired from one or more of the pixels included in a first region that is a portion of the pixel array part, subtracts a noise component from a pixel value acquired from one or more of the pixels included in a second region that is another portion of the pixel array part.
Inventors:
NISHIHARA TOSHIYUKI (JP)
MARUYAMA TSUTOMU (JP)
HARA MASAAKI (JP)
MARUYAMA TSUTOMU (JP)
HARA MASAAKI (JP)
Application Number:
PCT/JP2020/006640
Publication Date:
September 24, 2020
Filing Date:
February 19, 2020
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
SONY CORP (JP)
SONY CORP (JP)
International Classes:
G01J3/02; G01J3/443; G01N15/14; G01N21/64
Domestic Patent References:
| WO2014024556A1 | 2014-02-13 | |||
| WO2016121353A1 | 2016-08-04 |
Foreign References:
| JP2000033083A | 2000-02-02 |
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
Download PDF: