Title:
OPTICAL MEMBER, AND METHOD FOR INSPECTING DEFECTS IN ANTIREFLECTION MEMBER
Document Type and Number:
WIPO Patent Application WO/2017/115695
Kind Code:
A1
Abstract:
The present invention provides an optical member by which defects in an antireflection layer are readily detected. This optical member is provided with an antireflection member and a light-scattering member disposed on that surface of the antireflection member which is on the back surface side, the antireflection member having a substrate and an antireflection layer disposed on that surface of the substrate which is on the observation surface side, and the light-scattering member having a haze value of 6% or more. Also, this optical member is provided with an antireflection member and a removable low-reflectance member disposed on that surface of the antireflection member which is on the back surface side, the antireflection member having a substrate and an antireflection layer disposed on that surface of the substrate which is on the observation surface side, and the low-reflectance member having a reflectivity of less than 3.8%.
Inventors:
MINARI CHIAKI
Application Number:
PCT/JP2016/088018
Publication Date:
July 06, 2017
Filing Date:
December 21, 2016
Export Citation:
Assignee:
SHARP KK (JP)
International Classes:
G02B1/118; G02B1/111; G02B1/115; G02B5/02
Domestic Patent References:
| WO2011016270A1 | 2011-02-10 |
Foreign References:
| JP2001194506A | 2001-07-19 | |||
| JP2012052826A | 2012-03-15 |
Attorney, Agent or Firm:
YASUTOMI & ASSOCIATES (JP)
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