Title:
OPTICAL MODULE ADJUSTMENT METHOD AND EXAMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/210115
Kind Code:
A1
Abstract:
In the present invention, at least three beams of light in a test pattern projected from an optical module 1 are acquired by a wavefront sensor 9, the degree of parallelism of each beam is calculated, and the posture of a display panel 5 of the optical module is adjusted so that the degrees of parallelism of the beams match.
Inventors:
YOKOYAMA JUN
YONEMURA TATSUYA
URASHIMA TAKASHI
TAKECHI YOHEI
TACHIKA HIDEYUKI
YONEMURA TATSUYA
URASHIMA TAKASHI
TAKECHI YOHEI
TACHIKA HIDEYUKI
Application Number:
PCT/JP2023/005268
Publication Date:
November 02, 2023
Filing Date:
February 15, 2023
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01J9/00; G01M11/00; G03B21/00; G03B21/14; H04N5/74
Foreign References:
| JP2012018292A | 2012-01-26 | |||
| JP2006243139A | 2006-09-14 | |||
| JP2006208472A | 2006-08-10 | |||
| KR20030035779A | 2003-05-09 | |||
| JP2002014420A | 2002-01-18 | |||
| JP2000221589A | 2000-08-11 | |||
| JPH11178014A | 1999-07-02 | |||
| JPH09318923A | 1997-12-12 |
Attorney, Agent or Firm:
KAMATA Kenji et al. (JP)
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